Data Analysis of Digital Testing for a NAND Gate: Electrical and Business Approaches

Authors

  • Keyvan Mohammadi

Keywords:

Digital Test, Integrated Circuit, Nand Gate, Voh, Vol, Cpk, GRR, Busines

Abstract

The purpose of this paper is to describe the testing of a digital SN74HC00N NAND gate. The tests were derived from the part’s datasheet and were implemented not only to confirm the functionality of the device but also to see how well the chip can function when tested multiple times and with different equipment. The testing of each gate allowed for a better understanding of the device’s performance as well as the accuracy and performance of the testing instruments

Downloads

Published

2017-12-30

Issue

Vol. 4 No. 2 (2017)

Section

Articles

How to Cite

Mohammadi, K. (2017). Data Analysis of Digital Testing for a NAND Gate: Electrical and Business Approaches. International Academic Journal of Science and Engineering, 4(2), 47-58. https://iaiest.com/iaj/index.php/IAJSE/article/view/IAJSE1710025